Memory device capable of detecting its failure

Details Memory device capable of detecting its failure Memory device capable of detecting its failure

2007-08-23

2009-10-13

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S025000, C714S030000, C714S042000, C714S048000, C714S703000, C714S709000, C714S715000, C714S719000, C714S720000, C714S733000, C714S735000, C714S798000, C714S799000, C714S818000, C714S819000, C714S824000, C365S201000

Reexamination Certificate

active

07603596

ABSTRACT:
A memory device capable of detecting its failure, the memory device includes a data input section for receiving data applied from an external part of the memory device; a latch section for receiving and storing therein the data which have passed through the data input section; memory cell arrays for storing therein the data which have passed through the data input section; and a data compressor for determining whether or not the data stored in the latch section and the data stored in the memory cell arrays are identical to each other.

REFERENCES:
patent: 6163863 (2000-12-01), Schicht
patent: 6182254 (2001-01-01), Bae
patent: 6301171 (2001-10-01), Kim et al.
patent: 6311299 (2001-10-01), Bunker
patent: 6519726 (2003-02-01), Shibata
patent: 7013413 (2006-03-01), Kim et al.
patent: 7047461 (2006-05-01), Yamazaki et al.
patent: 7228477 (2007-06-01), Thalmann
patent: 7325173 (2008-01-01), Kikutake et al.
patent: 2006/0092681 (2006-05-01), Kawakubo

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