High-speed serial transfer device test data storage medium...
High-speed test system for a memory device
Hub for testing memory and methods thereof
Hub, memory module, memory system and methods for reading...
I/O compression circuit for a semiconductor memory device
IC test system
In-service raid mirror reconfiguring
Increasing possible test patterns which can be used with...
Information processing apparatus and nonvolatile...
Input/output compression test circuit
Integrated circuit and method for testing it
Integrated circuit and method for testing memory on the...
Integrated circuit devices with mode-selective external...
Integrated circuit having memory built-in self test (BIST) for d
Integrated circuit implementing internally generated commands
Integrated circuit in a maximum input/output configuration
Integrated circuit internal signal monitoring apparatus
Integrated circuit memory devices and methods for generating...
Integrated circuit memory devices including internal stress...
Integrated circuit test mode with externally forced reference vo