Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2007-12-11
2007-12-11
Kerveros, James C. (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
Reexamination Certificate
active
11076020
ABSTRACT:
An integrated circuit and method for testing memory on that integrated circuit includes processing logic operable to perform data processing operations on data, and a number of memory units operable to store data for access by the processing logic. A memory test controller is also provided for executing test events in order to seek to detect any memory defects in the number of memory units. The controller includes a storage operable to store event defining information for each of a plurality of test events forming a sequence of test events to be executed, and an interface which, during a single programming operation, receives the event defining information for each of the plurality of test events and causes that event defining information to be stored in the storage. Event processing logic within the controller is then operable, following the single programming operation, to execute the sequence of test events.
REFERENCES:
patent: 6560740 (2003-05-01), Zuraski et al.
patent: 6567325 (2003-05-01), Hergott
patent: 6769081 (2004-07-01), Parulkar
patent: 2004/0006729 (2004-01-01), Pendurkar
Backlund Brandon Michael
Frederick Frank David
Hughes Paul Stanley
Slobodnik Richard
ARM Limited
Kerveros James C.
Nixon & Vanderhye P.C.
LandOfFree
Integrated circuit and method for testing memory on the... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated circuit and method for testing memory on the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit and method for testing memory on the... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3885797