Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2006-07-25
2006-07-25
Decady, Albert (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S724000, C714S726000
Reexamination Certificate
active
07082558
ABSTRACT:
A non-robust test pattern, which causes a transition on a path of interest as well as off-paths, may be selected as being suitable for performing delay analysis of the path of interest (e.g., critical path) if the transitions caused on the off-paths would not overlap with the transition caused on the path of interest. In other words, an aspect of the present invention enables at least some non-robust test patterns to be used for performing delay analysis. As non-robust test patterns (as well as robust test patterns) can be used to perform delay analysis, the number of possible test patterns for performing speed analysis can be increased.
REFERENCES:
patent: 4366478 (1982-12-01), Masuda et al.
patent: 5422891 (1995-06-01), Bushnell et al.
patent: 5761215 (1998-06-01), McCarthy et al.
patent: 6249901 (2001-06-01), Yuan et al.
patent: 6708139 (2004-03-01), Rearick et al.
patent: 2002/0147951 (2002-10-01), Nadeau-Dostie et al.
patent: 2003/0154433 (2003-08-01), Wang et al.
Dervisoglu et al., Design for testability: using scanpath techniques for path-delay test and measurement, IEEE International Test Conference, Oct. 26-30, 1991, pp. 365-374.
Puneet Gupta; Jais Abraham; Rubin A. Parekhji; Entitled: “Improving Path Delay Coverage in Embedded Cores-Methodology and Experiments”; TI India Technical Conference 2001; 9 pages.
Abraham Jais
Brahme Amit
Deshamangala Shankaranarayana Karantha
Gupte Ajit D.
Brady III W. James
De'cady Albert
Gandhi Dipakkumar
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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