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Integrated circuit having a filler standard cell

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Integrated circuit probe pad metal level

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Integrated circuit provided with a substrate and memory...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Integrated circuit structures and methods to facilitate...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Integrated circuit test pad

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Integrated circuit wafer comprising unsingulated dies, and decod

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Integrated critical dimension control for semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Integrated microchip design

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Integrated multi-layer test pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Integrated semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Integrated semiconductor device including high-voltage...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Integrated system with modular microfluidic components

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Integrated test circuits having pads provided along scribe lines

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Inter-dice signal transfer methods for integrated circuits

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Interconnect with pressure sensing mechanism for testing semicon

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Interlevel dielectric thickness monitor for complex semiconducto

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Internal probe pads for failure analysis

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Internal-logic inspection circuit

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Interposer chip and multi-chip package having the interposer...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Interposer, semiconductor chip mounted sub-board, and...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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