Integrated circuit having a filler standard cell

Details Integrated circuit having a filler standard cell Integrated circuit having a filler standard cell

2009-04-13

2011-11-22

Smith, Bradley K (Department: 2894)

Active solid-state devices (e.g., transistors, solid-state diode

Test or calibration structure

C257SE27001, C438S018000

Reexamination Certificate

active

08063402

ABSTRACT:
An integrated circuit includes a functional block having a plurality of standard cells. The plurality of standard cells includes a plurality of functional standard cells and a filler standard cell. Each functional standard cell of the plurality of functional standard cells has a rectangular boundary. The filler standard cell has a rectangular boundary adjacent to at least one of the functional standard cells. The filler standard cell is selectable between a first state and a second state. The filler standard cell is non-functional in the first state. The filler standard cell has functional test structures coupled to a first metal layer in the second state. This allows for test structures helpful in analyzing functionality of circuit features such as transistors without requiring additional space on the integrated circuit.

REFERENCES:
patent: 2004/0133868 (2004-07-01), Ichimiya
patent: 2006/0190790 (2006-08-01), Pilling et al.
patent: 2009/0189195 (2009-07-01), Schroeder et al.

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