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Method and circuit layout for reducing post chemical...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method and device for determining backgate characteristics

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method and monitor structure for detecting and locating IC...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method and monitor structure for detecting and locating IC...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method and resulting structure for fabricating test key...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method and semiconductor structure for monitoring etch...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method and structure for measuring bridge induced by mask...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method and structure for testing metal-insulator-metal...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method and system for semiconductor die testing

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method and system for storing information using nano-pinned...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method for detecting and characterizing plasma-etch induced...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method for determining metal concentration in a field area

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method for fabricating a multi-level integrated circuit...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method for localizing point defects causing leakage currents...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method for selecting components for a matched set from a...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method for using a chip carrier substrate with a land grid...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method of deforming a pattern and semiconductor device...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method of detecting and distinguishing stack gate edge...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method of detecting misalignment of ion implantation area

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Method of detecting misalignment of ion implantation area

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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