Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2006-12-12
2006-12-12
Tran, Minhloan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257SE21523
Reexamination Certificate
active
07148505
ABSTRACT:
A carrier for a semiconductor die has a substrate with a cavity formed in the substrate. The cavity has a bottom and sidewalls, and the sidewalls have a stepped tier. Electrically conductive contacts are disposed on an underside of the substrate. Electrically conductive tabs are disposed on the stepped tier, and electrically conductive external bond terminals are disposed on an edge of the substrate. Electrically conductive paths are formed in the substrate and electrically coupled between the electrically conductive tabs, the electrically conductive contacts, and the electrically conductive external bond terminals.
REFERENCES:
patent: 5430734 (1995-07-01), Gilson
patent: 5838159 (1998-11-01), Johnson
patent: 6426638 (2002-07-01), Di Stefano
patent: 6747352 (2004-06-01), Huemoeller et al.
Actel Corporation
Dickey Thomas L.
Sierra Patent Group Ltd.
Tran Minhloan
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