X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-12-11
2008-10-28
Song, Hoon (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S156000
Reexamination Certificate
active
07443953
ABSTRACT:
An x-ray source comprises a structured anode that has a thin top layer made of the desired target material and a thick bottom layer made of low atomic number and low density materials with good thermal properties. In one example, the anode comprises a layer of copper with an optimal thickness deposited on a layer of beryllium or diamond substrate. This structured target design allows for the use of efficient high energy electrons for generation of characteristic x-rays per unit energy deposited in the top layer and the use of the bottom layer as a thermal sink. This anode design can be applied to substantially increase the brightness of stationary, rotating anode or other electron bombardment-based sources where brightness is defined as number of x-rays per unit area and unit solid angle emitted by a source and is a key figure of merit parameter for a source.
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Gstir, B., et al., “Calculated cross sections for the K-shell ionization of chromium, nickel, copper, scandium and vanadium using the DM formalism,” Jour. Phys. B: At. Mol. Opt. Phys., 34, 3372-3382, 2001.
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Duewer Frederick W.
Feser Michael
Seshadri Srivatsan
Tkachuk Andrei
Yun Wenbing
Houston Eliseeva LLP
Song Hoon
Xradia, Inc.
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