Subassembly, method and system for monochromatizing X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

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378 83, G01N 2322

Patent

active

046988335

ABSTRACT:
An improved X-ray monochromatizing subassembly, method and system are provided by a plurality of X-ray dispersive structures which are spaced and aligned to intercept X-rays and reflect monochromatized X-rays from the intercepted X-rays. The system includes a source of X-rays and an X-ray detector for detecting the monochromatized reflected X-rays. The monochromatized X-rays can be designed to be diverging, parallel or converging and can be designed for a particular wavelength of interest.

REFERENCES:
patent: 2688094 (1954-08-01), Dumond
patent: 4256961 (1981-03-01), Shoji et al.
patent: 4472825 (1984-09-01), Jenkins
patent: 4513434 (1985-04-01), Dunn
patent: 4525853 (1985-06-01), Keem et al.

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