Test structure for measuring a junction resistance in a DRAM...

Test structure for the measurement of contact to gate...

Test structures for measuring DRAM cell node junction...

Test system for segmented memory

Test terminal negation circuit for protecting data integrity

Testability apparatus and method for faster data access and sili

Testable nonvolatile semiconductor device

Testing a memory device having field effect transistors...

Testing a non-volatile memory

Testing an integrated circuit device

Testing and evaluation of a semiconductor memory containing redu

Testing and repair of wide I/O semiconductor memory devices desi

Testing arrangement for a DRAM with redundancy

Testing circuit for semiconductor memory array

Testing circuitry of internal peripheral blocks in a semiconduct

Testing device for testing a memory

Testing for SRAM memory data retention

Testing memory using a stress signal

Testing method and apparatus for dram

Testing method and device for non-volatile memories having a...