Built-in redundancy architecture for computer memories
Built-in redundancy architecture for computer memories
Built-in self test for integrated circuits having read/write mem
Built-in self-repair method for NAND flash memory and system...
Built-in self-test arrangement for integrated circuit memory dev
Built-in self-test arrangement for integrated circuit memory...
Built-in self-test arrangement for integrated circuit memory...
Built-in system and method for testing integrated circuit...
Built-in system and method for testing integrated circuit...
Built-in testing methodology in flash memory
Built-in-self-test scheme for testing multiple memory elements
Bulk bias voltage level detector in semiconductor memory device
Bulk bias voltage level detector in semiconductor memory device
Bulk voltage detector
Buried bit line ROM with low bit line resistance
Buried junction MOS memory capacitor target for electron beam ad
Buried sense line V-groove MOS random access memory
Buried-sidewall-strap two transistor one capacitor trench cell
Burn in system and method for improved memory reliability
Burn in system and method for improved memory reliability