Static information storage and retrieval – Floating gate – Particular connection
Reexamination Certificate
2008-08-19
2010-12-28
Luu, Pho M (Department: 2824)
Static information storage and retrieval
Floating gate
Particular connection
C365S200000, C365S201000, C365S049100
Reexamination Certificate
active
07859900
ABSTRACT:
A built-in self-test system applied to NAND flash memory comprises a built-in self-test circuit, a built-in redundancy-analysis circuit, a content addressable memory, a spare memory, a page-mode processor and an address generator. The built-in self-test circuit is configured to test for defective data in a NAND flash memory. The built-in redundancy-analysis circuit is connected to the built-in self-test circuit. The content addressable memory is connected to the built-in redundancy-analysis circuit for storing the address of the defective data. The spare memory is electrically connected to the content addressable memory. The page-mode processor is configured to generate a page address signal and a compensation signal according to an address signal of the NAND flash memory. The address generator is configured to generate a current address signal according to the page address signal and compensation signal to the content addressable memory.
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Hsiao Yu Ying
Wu Cheng Wen
King Anthony
Luu Pho M
National Tsing Hua University
WPAT, P.C.
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