Bulk bias voltage level detector in semiconductor memory device

Details Bulk bias voltage level detector in semiconductor memory device Bulk bias voltage level detector in semiconductor memory device

2008-04-29

2008-04-29

Nguyen, Viet Q. (Department: 2827)

Static information storage and retrieval

Powering

C365S189110, C365S189090, C365S228000, C365S229000

Reexamination Certificate

active

11323632

ABSTRACT:
There is provided a bulk bias voltage VBB level detector in a semiconductor memory device capable of improving tWR fail generated at a low temperature by compensating a temperature variance. The VBB level detector includes A bulk bias voltage level detector in a semiconductor memory device, comprising: a voltage divider for generating detection voltage based on an inputted bulk voltage; and a CMOS circuit for generating a output signal having predetermined logic value determined by the detection voltage wherein the voltage divider includes a first transistor having a gate coupled to a ground voltage and a second transistor having a gate coupled to an internal power voltage and a bulk coupled to the inputted bulk voltage.

REFERENCES:
patent: 4794278 (1988-12-01), Vajdic
patent: 5077671 (1991-12-01), Leslie et al.
patent: 5243228 (1993-09-01), Maruyama et al.
patent: 5392205 (1995-02-01), Zavaleta
patent: 5506540 (1996-04-01), Sakurai et al.
patent: 5668487 (1997-09-01), Chonan
patent: 5673232 (1997-09-01), Furutani
patent: 5721704 (1998-02-01), Morton
patent: 5736869 (1998-04-01), Wei
patent: 5740102 (1998-04-01), Kawashima
patent: 5760614 (1998-06-01), Ooishi et al.
patent: 5818290 (1998-10-01), Tsukada
patent: 5838189 (1998-11-01), Jeon
patent: 5886567 (1999-03-01), Park et al.
patent: 5920226 (1999-07-01), Mimura
patent: 6060930 (2000-05-01), Choi
patent: 6064250 (2000-05-01), Proebsting
patent: 6074899 (2000-06-01), Voldman
patent: 6169426 (2001-01-01), Lee et al.
patent: 6259310 (2001-07-01), Kawamura
patent: 6404258 (2002-06-01), Ooishi
patent: 6624685 (2003-09-01), Shih et al.
patent: 6661253 (2003-12-01), Lee et al.
patent: 6870410 (2005-03-01), Doyle et al.
patent: 6882215 (2005-04-01), Lee
patent: 6970024 (2005-11-01), Reese et al.
patent: 6-28853 (1994-02-01), None
patent: 00199244 (1998-07-01), None
patent: 00313078 (2002-10-01), None
patent: 1998-034255 (1998-08-01), None
patent: 2002-0069279 (2002-08-01), None

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