Static RAM including leakage current detector
Static RAM with test features
Static random access memory device with burn-in test circuit
Static random access memory device with memory cell testing circ
Static random access memory including stress test circuitry
Static random access memory SRAM having weak write test circuit
Static random access memory with reduced soft error rate
Static semiconductor memory device capable of accurately...
Static semiconductor memory device having a variable power suppl
Stress test for memory arrays in integrated circuits
Stress test for memory arrays in integrated circuits
Stress test mode
Stress test mode entry at power up for low/zero power memories
Structure and method for measuring the channel boosting...
Structure and method for screening SRAMS
Structure capable of simultaneously testing redundant and non-re
Structures for wafer level test and burn-in
Structures for wafer level test and burn-in
Supervoltage circuit
Sychronous memory burn-in method