Stress test for memory arrays in integrated circuits

Details Stress test for memory arrays in integrated circuits Stress test for memory arrays in integrated circuits

1995-06-02

1997-07-01

Zarabian, A.

Static information storage and retrieval

Read/write circuit

Testing

36518909, G11C 700

Patent

active

056445423

ABSTRACT:
A method for stress testing a memory array in an integrated circuit. Control circuitry selects a plurality of row lines at one time. An overvoltage suitable for stressing the cells of the array is placed on the bit lines. Because a block of cells has been selected, the overvoltage is applied to all cells of the block. The block of cells selected may be either the entire memory array or a portion of the memory array. The selected rows remain selected for the duration of the stress test. Because the overvoltage is applied directly to selected cells, the full overvoltage will be used to stress the transistor gates for the entire test period. In this manner, latent defects within the memory array can be detected.

REFERENCES:
patent: 4301535 (1981-11-01), McKenny et al.
patent: 4342103 (1982-07-01), Higuchi et al.
patent: 4651304 (1987-03-01), Takata
patent: 4751679 (1988-06-01), Dehganpour
patent: 5046049 (1991-09-01), Choi
patent: 5086413 (1992-02-01), Tsuboi
patent: 5208778 (1993-05-01), Kumanoya et al.
patent: 5258954 (1993-11-01), Furuyama
patent: 5276647 (1994-01-01), Matsui
patent: 5424988 (1995-06-01), McClure et al.
IBM Technical Disclosure Bulletin, "Fast method used to stress and test FET memory arrays". v 29, No. 12 (1987).

Affiliated with

Also associated with

Rating

Stress test for memory arrays in integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Stress test for memory arrays in integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Stress test for memory arrays in integrated circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-603103