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Flat interlayer insulating film suitable for multi-layer wiring

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent

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Flattening method and apparatus for semiconductor device

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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Flexible substrate with electronic devices formed thereon

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

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Fluid pressure imprint lithography

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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Formation of sub-groundrule features

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent

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Forming a substantially planar upper surface at the outer...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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GCIB processing to improve interconnection vias and improved...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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Glass substrate for magnetic recording medium, magnetic...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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Global planarization method and apparatus

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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Global planarization process for high step DRAM devices via...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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Global planarization using self aligned polishing or spacer tech

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent

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Global planarization using SOG and CMP

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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Hardening of copper to improve copper CMP performance

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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Headless CMP process for oxide planarization

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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High aspect ratio gapfill process by using HDP

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent

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High density contacts having rectangular cross-section for...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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High PH slurry for chemical mechanical polishing of copper

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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High removal rate chemical-mechanical polishing

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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High through-put Cu CMP with significantly reduced erosion...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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High-speed planarizing apparatus and method for chemical mechani

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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