LandOfFree - US Patents - Listing for Scanning-probe techniques or apparatus; applications of scanning

Probe arrangement

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;...

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Probe device for a metrology instrument and method of...

Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe manufacture

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Probe for scanning over a substrate and a data storage device

Scanning-probe techniques or apparatus; applications of scanning – Applications of scanning-probe techniques other than spm

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Probe microscopy and probe position monitoring apparatus

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes

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Probe system comprising an electric-field-aligned probe tip...

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;...

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Probe testing structure

Scanning-probe techniques or apparatus; applications of scanning – Calibration aspect – e.g. – calibration of probes

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Process for manufacturing probes intended to interact with a...

Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe manufacture

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Protein microscope

Scanning-probe techniques or apparatus; applications of scanning – Auxiliary means serving to assist or improve the scanning... – Non-spm analyzing devices – e.g. – scanning electron...

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Rotatable multi-cantilever scanning probe microscopy head

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Multiple-type spm – i.e. – involving two or more spm techniques

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Scan type probe microscope and cantilever drive device

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes

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Scanning ion conductance microscopy for the investigation of...

Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe characteristics

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Scanning measurement instrument

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;...

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Scanning probe in pulsed-force mode, digital and in real time

Scanning-probe techniques or apparatus; applications of scanning – Auxiliary means serving to assist or improve the scanning... – Display or data processing devices

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Scanning probe microscope and active damping drive control...

Scanning-probe techniques or apparatus; applications of scanning – Scanning or positioning arrangements – i.e. – arrangements for... – Fine scanning or positioning

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Scanning probe microscope and method of operating the same

Scanning-probe techniques or apparatus; applications of scanning – Scanning or positioning arrangements – i.e. – arrangements for... – Fine scanning or positioning

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Scanning probe microscope and scanning method

Scanning-probe techniques or apparatus; applications of scanning – Scanning or positioning arrangements – i.e. – arrangements for... – Fine scanning or positioning

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Scanning probe microscope apparatus

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes

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Scanning probe microscope having improved optical access

Scanning-probe techniques or apparatus; applications of scanning – Monitoring the movement or position of the probe responsive... – By optical means

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Scanning probe microscope probe and manufacturing method...

Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe characteristics

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Scanning probe microscope system

Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their...

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