Scanning probe microscope system

Details Scanning probe microscope system Scanning probe microscope system

2005-07-01

2009-08-25

Vanore, David A (Department: 2881)

Scanning-probe techniques or apparatus; applications of scanning

General aspects of spm probes, their manufacture, or their...

C850S053000, C850S056000, C850S057000, C250S306000, C250S307000, C250S442110, C073S105000, C324S724000, C977S849000, C977S851000, C977S860000, C977S872000, C977S873000

Reexamination Certificate

active

07578853

ABSTRACT:
A scanning probe microscope system comprising a hollow probe3,a tube4connected to a rear end32of the hollow probe3,a support table1provided under the hollow probe3,and a substrate2and a means5for washing the hollow probe3that are fixed to the support table1,a sample S passing through the tube4and the hollow probe3,and the substrate2and the washing means5being moved by the support table1such that each of them opposes the hollow probe3.

REFERENCES:
patent: 4282481 (1981-08-01), Dunn
patent: 5132533 (1992-07-01), Kawase et al.
patent: 5166520 (1992-11-01), Prater et al.
patent: 5440122 (1995-08-01), Yasutake
patent: 5630932 (1997-05-01), Lindsay et al.
patent: 2005/0016952 (2005-01-01), Hamann et al.
patent: 2005/0074363 (2005-04-01), Dunfee
patent: 2007/0008390 (2007-01-01), Cruchon-Dupeyrat et al.
patent: 2008/0131325 (2008-06-01), Espinosa et al.
patent: 0431623 (1991-06-01), None
patent: 02-163388 (1990-06-01), None
patent: 04-337402 (1992-11-01), None
patent: 04337402 (1992-11-01), None
patent: 05-27666 (1993-04-01), None
patent: 06-223766 (1994-08-01), None
patent: 07-049352 (1995-02-01), None
patent: 09-251979 (1997-09-01), None
patent: 2001-014716 (2001-09-01), None
patent: 2001-255256 (2001-09-01), None
patent: 2002307247 (2002-10-01), None
patent: 2003-254886 (2003-09-01), None

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