Probe for scanning over a substrate and a data storage device

Details Probe for scanning over a substrate and a data storage device Probe for scanning over a substrate and a data storage device

2008-08-07

2010-12-07

Berman, Jack I (Department: 2881)

Scanning-probe techniques or apparatus; applications of scanning

Applications of scanning-probe techniques other than spm

C850S001000, C850S002000, C850S003000, C850S063000, C073S866500, C365S220000, C365S221000, C365S222000, C369S013010, C369S015000, C369S127000

Reexamination Certificate

active

07849516

ABSTRACT:
A method of scanning over a substrate includes implementing a write mode of the substrate by scanning a probe across a substrate, the probe having a spring cantilever probe mechanically fixed to a probe holding structure, a tip with a nanoscale apex, and an actuator for lateral positioning of the tip; the actuator comprising a thermally switchable element and a heating element for heating the thermally switchable element; and heating the heating element to a given temperature so as to locally soften a portion of the substrate and applying a force to the softened portion of the substrate through the tip so as to create one or more indentation marks in the softened portion of the substrate.

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