Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Multiple-type spm – i.e. – involving two or more spm techniques
Reexamination Certificate
2007-06-25
2009-10-06
Berman, Jack I (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
Particular type of scanning probe microscopy or microscope;...
Multiple-type spm, i.e., involving two or more spm techniques
C850S021000, C850S023000, C850S024000, C850S025000, C977S849000, C977S860000, C977S874000
Reexamination Certificate
active
07597717
ABSTRACT:
A scanning probe microscopy head may include a base portion, cantilevers coupled to the base portion, and at least one tip coupled to each of the cantilevers. At least two of the cantilevers and associated tips may be configured to perform a different scanning probe microscopy technique. The cantilevers may be positioned perpendicular to the base portion and may be coupled to the perimeter of the base portion. The base portion may include circuitry coupled thereto for providing electricity to the tips. The cantilevers may each be placed into a recessed slot along the perimeter of the base and secured to the base by a securing mechanism, such as a spring clip. The cantilevers may be operatively coupled to a linear positioner, such as a piezoelectric motor, coupled to the perimeter of the base for controlling the amount of protrusion of the cantilevers from the perimeter of the base.
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Lu Ryan P.
Ramirez Ayax D.
Russell Stephen D.
Berman Jack I
Eppele Kyle
Friedl Ryan J.
Purinton Brooke
The United States of America as represented by the Secretary of
LandOfFree
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