Probe system comprising an electric-field-aligned probe tip...

Details Probe system comprising an electric-field-aligned probe tip... Probe system comprising an electric-field-aligned probe tip...

2006-10-10

2010-06-08

Nguyen, Kiet T (Department: 2881)

Scanning-probe techniques or apparatus; applications of scanning

Particular type of scanning probe microscopy or microscope;...

C073S105000

Reexamination Certificate

active

07735147

ABSTRACT:
A mechanically stable and oriented scanning probe tip comprising a carbon nanotube having a base with gradually decreasing diameter, with a sharp tip at the probe tip. Such a tip or an array of tips is produced by depositing a catalyst metal film on a substrate (10 & 12in FIG.1(a)), depositing a carbon dot (14in FIG.1(b)) on the catalyst metal film, etching away the catalyst metal film (FIG.1(c)) not masked by the carbon dot, removing the carbon dot from the catalyst metal film to expose the catalyst metal film (FIG.1(d)), and growing a carbon nanotube probe tip on the catalyst film (16in FIG.1(e)). The carbon probe tips can be straight, angled, or sharply bent and have various technical applications.

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