Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe characteristics
Reexamination Certificate
2011-08-23
2011-08-23
Souw, Bernard E (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
General aspects of spm probes, their manufacture, or their...
Probe characteristics
C250S428000, C422S068100, C422S501000, C422S502000, C073S104000, C073S105000, C435S004000
Reexamination Certificate
active
08006316
ABSTRACT:
A method for interrogating a surface using scanning probe microscopy comprises bringing a scanning probe into proximity with the surface and controlling the position of the probe relative to the surface to maintain a constant distance, characterized in that pressure is applied to the surface by a regulated flow of liquid through the probe, with subsequent monitoring of the position of the probe, wherein movement of the probe indicates a consequent movement of the surface.
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Korchev Yuri Evgenievich
Lab Max Joseph
Sànchez-Herrera Daniel Paulo
Ionscope Ltd
Saliwanchik Lloyd & Eisenschenk
Souw Bernard E
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