Probe microscopy and probe position monitoring apparatus

Details Probe microscopy and probe position monitoring apparatus Probe microscopy and probe position monitoring apparatus

2008-04-09

2011-11-01

Wells, Nikita (Department: 2881)

Scanning-probe techniques or apparatus; applications of scanning

Particular type of scanning probe microscopy or microscope;...

Atomic force microscopy or apparatus therefor, e.g., afm probes

C850S006000, C850S008000, C250S306000, C250S307000, C073S105000

Reexamination Certificate

active

08051493

ABSTRACT:
A method of determining the position of a probe tip. An evanescent electromagnetic field is generated extending beyond an interface boundary between a first medium, having a first refractive index, and a second medium, having a second refractive index which is greater than the first refractive index, the interface boundary extending in a plane. A probe tip is positioned in the evanescent field in the first medium thereby causing propagating electromagnetic radiation to be produced as a result of the disruption of the evanescent field by the probe tip, and at least a portion of the propagating electromagnetic radiation is collected. The spatial intensity distribution of the collected radiation is detected with respect to an image plane. An at least one dimensional position of the probe tip in a probe tip plane is determined from the detected spatial intensity distribution, the probe tip plane being a plane which contains the probe tip and which is substantially parallel to the plane of the interface boundary.

REFERENCES:
patent: 5509300 (1996-04-01), Chamberlain et al.
patent: 5774221 (1998-06-01), Guerra
patent: 6159742 (2000-12-01), Lieber et al.
patent: 7234343 (2007-06-01), Ducker et al.
patent: 7271574 (2007-09-01), Xiang et al.
patent: 2004/0232321 (2004-11-01), Miles et al.
patent: 2006/0005615 (2006-01-01), Ducker et al.
patent: 195 31 466 (1996-10-01), None
patent: 0 795 770 (1997-09-01), None
patent: 2006 090715 (2006-04-01), None
patent: WO/2006/008550 (2006-01-01), None
Y. Inouye et al., “Near-Field Scanning Optical Microscope With a Metallic Probe Tip,” Optics Letters, OSA, Optical Society of America, Washington, DC, US, vol. 19, No. 3, Feb. 1, 1994, pp. 159-161.
D. Courjon et at., “External and Internal Reflection Near Field Microscopy: Experiments and Results”, Applied Optics USA, vol. 29, No. 26, Sep. 10, 1990, pp. 3734-3740.
International Search Report for International Application No. PCT/GB2008/001236 mailed Jun. 13, 2008.
International Preliminary Report on Patentability mailed Apr. 2, 2009.

Affiliated with

Also associated with

Rating

Probe microscopy and probe position monitoring apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe microscopy and probe position monitoring apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe microscopy and probe position monitoring apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4280424