Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe characteristics
Reexamination Certificate
2005-04-22
2009-06-30
Vanore, David A (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
General aspects of spm probes, their manufacture, or their...
Probe characteristics
C250S306000, C250S307000, C850S021000, C850S052000, C850S056000
Reexamination Certificate
active
07553335
ABSTRACT:
A scanning probe microscope probe is produced by depositing a raw-material film on the surface of a cone made of Si, etc. and growing a needle-like crystal by using the raw-material film by irradiating an energy beam to a point on the cone at a predetermined distance along the side surface from the cone tip under such conditions as not to melt the cone. Also, a charge density wave quantum phase microscope is provided which uses a probe made of a charge density wave crystal. Also, a charge density wave quantum interferometer is provided which uses the needle-like crystal formed from the charge density wave crystal. Also, the scanning probe microscope probe is formed from a pressure-induced superconducting substance.
REFERENCES:
patent: 2002/0117467 (2002-08-01), Tanda et al.
patent: 4-233406 (1992-08-01), None
patent: 2002-181682 (2002-06-01), None
patent: 2003-240700 (2003-08-01), None
Ookawa et al., “TaS2, TaSe2 Denka Mitsudoha (CDW) ni yoru Sosagata Kenbikyo no Kaihatsu,” Dai 51 Kai Oyo Butsurigaku Kankei Rengo Koenkai Koen Yokoshu, separate Vo. 2, Mar. 28, 2004, p. 744.
Golberg, et al., “Nanotubes in boron nitride laser heated at high pressure,” Applied Physics Letters, Sep. 30, 1996, vol. 69, No. 14, pp. 2045-2047.
Bonnet et al., “Needles of WO2.9 Grown in an Electron Microscope,” Journal of Crystal Growth, 1982, vol. 56, No. 3, pp. 633-638.
Okajima et al., “Atarashii CDW Kanshokei ni okeru Hisenkei Denki Dendo no Kansoku,” The Physical Society of Japan Koen Gaiyoshu, 1999 vol. 54, No. 2, (1999 Nen Aki no Bunkakai), separate vol. 4, p. 698.
Tanba et al., “Atarashii topology o Motsu Ring-jo oyobi Tube-jo CDW Busshitsu no Sosei,” The Physical Society of Japan Koe Gaiyoshu, 1999, vol. 54, No. 2, seprate vol. 4, p. 776.
Adelman, “S.V. Zaitsev-Zotov, and R.E. Thorne, Field-Effect Modulation of Charge-Density-Wave Transport in NbSe3 and TaS3,” Physical review Letter, Jun. 26, 1995, vol. 74,, No. 26, p. 5264-5267.
Ido Masayuki
Inagaki Katsuhiko
Momono Naoki
Nishida Munehiro
Oda Migaku
Japan Science and Technology Agency
K & L Gates LLP
Maskell Michael
Vanore David A
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