Scan type probe microscope and cantilever drive device
Scanning ion conductance microscopy for the investigation of...
Scanning measurement instrument
Scanning probe in pulsed-force mode, digital and in real time
Scanning probe microscope and active damping drive control...
Scanning probe microscope and method of operating the same
Scanning probe microscope and scanning method
Scanning probe microscope apparatus
Scanning probe microscope having improved optical access
Scanning probe microscope probe and manufacturing method...
Scanning probe microscope system
Scanning probe microscopy cantilever, corresponding...
Scanning system for optical transmitter beams
Short and thin silicon cantilever with tip and fabrication...
Smart materials: strain sensing and stress determination by...
Spin-torque probe microscope
SPM probe with shortened cantilever
Substrate patterning by electron emission-induced displacement