Film thickness measurement using electron-beam induced x-ray...

Filtered e-beam inspection and review

Filtered e-beam inspection and review

Fine adjustment mechanism for a scanning tunneling microscope

Fine adjustment mechanism for a scanning tunneling microscope

Fine pattern inspection apparatus and method and managing...

Fine positioning apparatus with atomic resolution

Fine positioning device, as for the stage of a scanning tunnelin

Fine scanning mechanism for atomic force microscope

Fine stencil structure correction device

Fine-adjustment mechanism for scanning probe microscopy

Flexible cable control and take-up mechanism

Flow meter

Fluid flow control method and apparatus for an ion implanter

Focused ion beam apparatus

Focused ion beam apparatus

Focused ion beam apparatus and focused ion beam irradiation...

Focused ion beam apparatus and method

Focused ion beam apparatus and method of preparing/observing...

Focused ion beam apparatus having charged particle energy filter