Removal of spectral artifacts and utilization of spectral effect

Repetitive circumferential milling for sample preparation

Resolving power evaluation method and specimen for electron micr

Restoration of CD fidelity by dissipating electrostatic charge

Retractable cathodoluminescence detector with high ellipticity a

Retractable lens-coupled electron microscope camera with...

Right angle driving

Rod-shaped specimen holder for an optical corpuscular-beam appar

Rotatable support for selectively aligning a window with the cha

Rotatable wide angle camera and prism assembly for electron micr

Rotating specimen holder

Rotational stage for high speed, large area scanning in...

Rotational stage for high speed, large area scanning in...

Rule based control for charged-particle beam instrument

Rutherford backscattering surface analyzer with 180-degree defle