Search
Selected: All

Apparatus and method for measuring the thickness of a semiconduc

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and method for optical control of the profile of a bod

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and method for performing high spatial resolution thin

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and method for performing thin film layer thickness me

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and method for real-time measurement of thin film laye

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and method for testing liquid crystal display panel

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and method for verifying the coplanarity of a ball gri

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and method to measure and monitor the coating of objec

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and methods for determining overlay and uses of same

Optics: measuring and testing – By configuration comparison
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and process for automatically measuring aperture size

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and process for measuring the unroundness and...

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and system for linewidth measurements

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus and system for linewidth measurements

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus for detecting defects in patterns

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus for detecting defects in patterns

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus for detecting image area of thin plate

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus for detecting irregularities in the diameter of a fila

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus for determining the thickness of an optical sample

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus for examining the external appearance of solid article

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Apparatus for inspecting a phase shift mask

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.