Apparatus for determining the thickness of an optical sample

Details Apparatus for determining the thickness of an optical sample Apparatus for determining the thickness of an optical sample

1997-08-29

1999-02-09

Kim, Robert

Optics: measuring and testing

By configuration comparison

With photosensitive film or plate

356244, 359396, G01B 1006

Patent

active

058702008

ABSTRACT:
The present invention relates to the field of quantitative microspectroscopy, and in particular to an apparatus for determining the exact thickness of an optical microscopic sample at the time an absorbance measurement or other spectroscopic measurements are performed on this sample. This apparatus can be an optical microscope comprising a means for containing a sample wherein said means has first and second optical markers; a means for holding said means for containing a sample; a means for illuminating the sample in said means for containing a sample; a means for automatically focusing on first and second optical markers in said means for containing a sample; and a means for performing a pattern recognition procedure for said optical samples, wherein said means comprises an imaging receiver which is connected to an image processor and a computer.

REFERENCES:
patent: 5202740 (1993-04-01), Kivits
patent: 5696589 (1997-12-01), Bernacki

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