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Method and apparatus for remote detection and thickness measurem

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for remote detection and thickness measurem

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for surveying clearances on railway tracks

Optics: measuring and testing – By configuration comparison – With object being compared and scale superimposed
Patent

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Method and apparatus for testing automatic insertion state of el

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method and apparatus for the automated analysis of three-dimensi

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method and apparatus for the inspection of patterns

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method and apparatus for use in measurement of the position of a

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method and apparatus for verifying the presence of a material ap

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method and apparatus for white-light dispersed-fringe interferom

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus of determining the true edge length of a bo

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and assembly for measuring an article's dimensions

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method and device for coin diameter discrimination

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for contact-free interval or thickness measure

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for controlling the film thickness of evaporat

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for determining the area coverage of an origin

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for determining the thickness and concentricit

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for in situ stress measurement within a thin f

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for inspecting bags

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method and device for measuring parts

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Method and device for measuring the length of a light guide

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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