Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1996-09-18
1998-03-17
Font, Frank G.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356388, 356400, G01B 1100
Patent
active
057293465
ABSTRACT:
Disclosed is a method and an apparatus capable of easily and quickly testing an automatic inserting state of an electronic component in a printed circuit board using a slit light. The method and the apparatus makes use of a slit light type instead of using the conventional testing jig in order to test an automatic insertion state of an electronic component in a printed circuit board. Thus, the problem of a noise generated when applying a signal which indicates that the contacting pins of the electronic component contacting with pins of a jig are testing incorrect, can be solved. Also, the setup time of an apparatus for testing an automatic insertion state of an electronic component in a printed circuit board according to changing a design of the printed circuit board can be reduced.
REFERENCES:
patent: 5329359 (1994-07-01), Tachikawa
patent: 5408189 (1995-04-01), Swart et al.
Daewoo Electronics Co. Ltd.
Font Frank G.
Ratliff Reginald A.
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