Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1996-04-03
1997-08-05
Font, Frank G.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356376, 356372, G01B 1100
Patent
active
056548028
ABSTRACT:
A method for inspecting bags having folded and pasting bottoms. Light source is provided to irradiate a bottom of a moving bag with a light so that shadows appear along a shape of bottom folds. A CCD linear array image sensor takes an image of the bottom of the bag from the reflected light and delivers electric signal corresponding to the image. The electrical signal are processed to extract a shape of bottom folds based on the shadows on the irradiated bottom. The obtained outer profile is compared with a reference input of a good bag stored in a memory to emit an electric selection signal classifying whether it is a good product or a defective product.
REFERENCES:
patent: 3433135 (1969-03-01), Lokey et al.
patent: 3524389 (1970-08-01), Stork
patent: 3581629 (1971-06-01), Wiendieck
patent: 3583296 (1971-06-01), Stork et al.
patent: 3643552 (1972-02-01), Stork
patent: 4258267 (1981-03-01), Feldkamper
patent: 4645339 (1987-02-01), Feldkamper
patent: 4896211 (1990-01-01), Hunt et al.
Bando Eiji
Kurachi Akira
Font Frank G.
Oji Seitai Kaisha, Ltd.
Ratliff Reginald A.
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