Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1988-10-11
1991-07-09
Evans, F. L.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356376, 356237, 358101, 358106, 382 8, G01B 1124
Patent
active
050300083
ABSTRACT:
An optomechanical system for illuminating and imaging selected portions of a three dimensional object having specularly reflective surfaces, including a two dimensional image sensor for receiving light reflected from the selected portions and producing an analog output signal representing a two dimensional image of the selected portions over a predetermined time period, a video digitizer for receiving and converting the analog output signal to a digital signal, and an image computer for receiving the digital signal output by the video digitizer, comparing the information obtained from the output digital signal to the stored specifications of a master of the imaged portion of the object, indicating whether the imaged object meets the specifications of the master, controlling the movement of the imaged object, and controlling the operation of the system.
REFERENCES:
patent: 4648053 (1987-03-01), Fridge
patent: 4677473 (1987-06-01), Okamoto et al.
patent: 4876455 (1989-10-01), Sanderson et al.
Filice Franco A.
Scott Richard S. F.
Uziel Yoram
Evans F. L.
KLA Instruments Corporation
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