Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1992-11-02
1994-10-25
Rosenberger, Richard A.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
250560, A01N 2186
Patent
active
053594185
ABSTRACT:
A photometric gauge for measuring the diameters of a workpiece turned about a central axis. The apparatus comprises a light source which scans a light beam across and on either side of a workpiece, to reflect scanned light from a mirror having an approximately elliptical curvature. The light source is located at one focus of the elliptical mirror and a light detector is located at the other focus. Light passing beside the workpiece from the light source focus reflects back to the light detector focus, and the light detector generates an electrical signal. The signal is used by an electronic data processor, along with known geometric parameters, to determine the diameter of the workpiece. A profiler, using the above photometric gauge, takes diameter measurement at regular intervals along the axis of the workpiece, and plots the diameter versus axial position data.
REFERENCES:
patent: 3854052 (1974-12-01), Asar et al.
patent: 4427296 (1984-01-01), Demarest et al.
patent: 4855608 (1989-08-01), Peterson
patent: 4859862 (1989-08-01), Planke et al.
Foster Frank H.
Omnitech Electronics, Inc.
Rosenberger Richard A.
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