Photoeletric type measuring method and device

Details Photoeletric type measuring method and device Photoeletric type measuring method and device

1987-03-13

1988-10-18

Rosenberger, R. A.

Optics: measuring and testing

By configuration comparison

With photosensitive film or plate

250560, G01B 1108

Patent

active

047782714

ABSTRACT:
In a photoelectric type measuring method and device wherein a workpiece to be measured is scanned by parallel scanning ray beams for scanning in one direction, aforesaid ray beams after the scanning are received by light receiving elements and a time length of a dark portion or a bright portion generated due to the obstruction of a portion of the ray beams by workpiece to be measured in response to output signals from the light receiving elements is detected so as to obtain the dimension in the scanning direction of the workpiece to be measured, the aforesaid ray beams are split into ray beams polarized in directions different from each other, the workpiece to be measured is scanned in such a condition that the two ray beams are relatively shifted so that the two ray beam may be partially overlapped in the scanning directions thereof and light receiving signals corresponding to the two ray beams after the scanning are processed to detect and edge of the workpiece to be measured.

REFERENCES:
patent: 3853406 (1974-12-01), Zanoni
patent: 4129384 (1978-12-01), Walker et al.

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