Lead inspection system for surface-mounted circuit packages

Details Lead inspection system for surface-mounted circuit packages Lead inspection system for surface-mounted circuit packages

1988-02-08

1989-10-24

Evans, F. L.

Optics: measuring and testing

By configuration comparison

With comparison to master, desired shape, or reference voltage

356237, 356372, G01B 1100

Patent

active

048757799

ABSTRACT:
An electro-optical system for detecting selected geometrical properties of leads on circuit packages of the surface-mounted type. The system employs a vertically-arranged linear array of photosensitive elements which is carried horizontally parallel to a reference surface and operated to provide a series of one-dimensional scans vertically along the leads.

REFERENCES:
patent: 3781467 (1973-12-01), Soames
patent: 4520702 (1985-06-01), Davis et al.
patent: 4549087 (1985-10-01), Duncen et al.
patent: 4688939 (1987-08-01), Ray
patent: 4696047 (1987-09-01), Christian et al.
patent: 4728195 (1988-03-01), Silver
Brochure "Surface Mount Lead Inspection System", Texas Instruments.

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