Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate
2005-03-08
2005-03-08
Font, Frank G. (Department: 2877)
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
C356S435000, C356S445000
Reexamination Certificate
active
06864980
ABSTRACT:
A wavelength detector includes a beam splitter block that taps off two spatially separated beams and a linear filter in an optical path of one of the two beams. The linear filter may be provided on the beam splitter block. The linear filter may be a notch anti-reflective filter in the optical path of the application beam. One or both of the beams may be focused on to their respective detectors.
REFERENCES:
patent: 5896201 (1999-04-01), Fukushima
patent: 6639679 (2003-10-01), Frojdh
patent: 6661818 (2003-12-01), Feldman et al.
Boye Robert Russell
Cruz-Cabrera Alvaro A.
Schwartz Eric
Te Kolste Robert
Digital Optics Corp.
Font Frank G.
Lauchman Layla
Morse Susan S.
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