Semiconductor memory device capable of accessing all memory...

Semiconductor memory device capable of arbitrarily setting...

Semiconductor memory device capable of changing ECC code length

Semiconductor memory device capable of fast testing without exte

Semiconductor memory device capable of testing memory cells...

Semiconductor memory device equipped with error correction...

Semiconductor memory device equipped with error correction...

Semiconductor memory device equipped with error correction...

Semiconductor memory device having a multibit test mode

Semiconductor memory device having a test circuit

Semiconductor memory device having a test control circuit

Semiconductor memory device having advanced test mode

Semiconductor memory device having advanced test mode

Semiconductor memory device having advanced test mode

Semiconductor memory device having an ECC circuit

Semiconductor memory device having burn-in test mode and...

Semiconductor memory device having data holding mode using...

Semiconductor memory device having deterioration determining fun

Semiconductor memory device having deterioration determining...

Semiconductor memory device having deterioration determining...