Semiconductor memory device having a test circuit

Details Semiconductor memory device having a test circuit Semiconductor memory device having a test circuit

2006-08-29

2006-08-29

Beausoliel, Robert (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S006130, C714S006130, C714S006130, C714S710000, C714S711000, C365S200000, C365S201000

Reexamination Certificate

active

07100090

ABSTRACT:
A semiconductor memory device includes memory cells, redundant cells, a redundancy repair control circuit and a test mode control circuit. Each of the memory cells is assigned a unique address to be accessed by a corresponding address. The redundant cells are replaceable with the memory cells. The redundancy repair control circuit replaces predetermined memory cells among the memory cells with the redundant cells. The test mode control circuit invalidates an operation of the redundancy repair control circuit and assigns an additional unique address to the redundant cells so that all of the memory cells and the redundant cells are accessible during a test mode.

REFERENCES:
patent: 5809225 (1998-09-01), Ohsawa et al.
patent: 5841709 (1998-11-01), McClure
patent: 6182257 (2001-01-01), Gillingham
patent: 6208570 (2001-03-01), Brown et al.
patent: 6259636 (2001-07-01), Fukuda et al.
patent: 6349064 (2002-02-01), Nakaoka
patent: 6411556 (2002-06-01), Amano
patent: 6483773 (2002-11-01), Fister
patent: 6735727 (2004-05-01), Lee
patent: 6967878 (2005-11-01), Dono

Affiliated with

Also associated with

Rating

Semiconductor memory device having a test circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor memory device having a test circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device having a test circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3686599