Semiconductor memory device capable of accessing all memory...

Details Semiconductor memory device capable of accessing all memory... Semiconductor memory device capable of accessing all memory...

2004-02-12

2008-05-06

Iqbal, Nadeem (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

Reexamination Certificate

active

07370237

ABSTRACT:
A semiconductor memory device according to embodiments of the invention includes N channels for interface with an outside. During a test mode where the semiconductor memory device is tested by a tester having M channels, K ones of the N channels of the memory device are connected to the M channels of the tester, N being more than M and M being equal to or more than R*K (where R is an integer).

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