Memory device and method for redundancy/self-repair
Memory device and method for repairing a semiconductor memory
Memory device and method for storing bits in non-adjacent...
Memory device and system with cyclic, ECC-corrected...
Memory device capable of detecting its failure
Memory device capable of detecting its failure
Memory device employing dual clocking for generating...
Memory device fail summary data reduction for improved...
Memory device for repairing a neighborhood of rows in a...
Memory device for use in high-speed block pipelined...
Memory device generator for generating memory devices with...
Memory device having redundant cells
Memory device including redundancy routine for correcting...
Memory device internal parameter reliability
Memory device method for operating a system containing a...
Memory device redundant repair analysis method, recording...
Memory device test system and method
Memory device testing apparatus
Memory device testing apparatus and data selection circuit
Memory device testing system and method having real time...