Memory device internal parameter reliability

Details Memory device internal parameter reliability Memory device internal parameter reliability

2009-05-04

2010-10-19

Iqbal, Nadeem (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

Reexamination Certificate

active

07818611

ABSTRACT:
Embodiments herein may store redundant copies of an operational parameter associated with an internal operation of a memory device. The redundant copies and associated parity bits may be stored in sets of writeable, non-volatile storage cells. A working area of the memory device may subsequently be populated with one or more redundant copies of the operational parameter, with a flag associated with the operational parameter, or with both. Other embodiments are described and claimed.

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