Memory device fail summary data reduction for improved...

Details Memory device fail summary data reduction for improved... Memory device fail summary data reduction for improved...

2006-03-06

2008-10-28

Chung, Phun M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000

Reexamination Certificate

active

07444566

ABSTRACT:
A method and apparatus is presented for extracting sparse failure information from an error data image of a memory device by scanning the error data image in only two passes. During a first scan pass, the error data image is scanned for failures in a first set of memory cell groups organized along a first dimension, keeping track of failures seen in each of the respective memory cell groups in the first set, and keeping track of and designating as a must-repair memory cell group any memory cell group whose respective number of failures equals or exceeds a first maximum failure threshold. During a second scan pass, the error data image is scanned for failures in a second set of memory cell groups organized along a second dimension, keeping track of failures seen in each of the respective memory cell groups in the second set, and keeping track of and designating as a must-repair memory cell group any memory cell group whose respective number of failures equals or exceeds a second maximum failure threshold; and generating tag images containing only sparse failure information.

REFERENCES:
patent: 6667918 (2003-12-01), Leader et al.
patent: 7055074 (2006-05-01), Hughes et al.
patent: 7339844 (2008-03-01), Krech et al.

Affiliated with

Also associated with

Rating

Memory device fail summary data reduction for improved... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory device fail summary data reduction for improved..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory device fail summary data reduction for improved... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3991912