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Circuit analyzer of black, gray and transparent elements

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Circuit and method for adding parametric test capability to...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Circuit and method for checking and recovering a disk array

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Circuit and method for configuring CAM array margin test and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Testing of error-check system
Reexamination Certificate

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Circuit and method for convolutional interleaving using a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Data formatting to improve error detection correction...
Reexamination Certificate

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Circuit and method for correcting erroneous data in memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Circuit and method for error detection

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Circuit and method for error detection

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Circuit and method for fuse disposing in a semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Circuit and method for improving memory integrity in a...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Circuit and method for increasing scan cell observability of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit and method for integrated circuit configuration

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit and method for masking a dormant memory cell

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Circuit and method for masking a dormant memory cell

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Circuit and method for masking a dormant memory cell

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Circuit and method for performing built-in self test and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Circuit and method for performing tests on memory array...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Circuit and method for rapid checking of error correction codes

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Patent

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Circuit and method for stress testing EEPROMS

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Circuit and method for test and repair

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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