Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-08-23
2011-08-23
Gaffin, Jeffrey A (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S729000, C714S731000
Reexamination Certificate
active
08006150
ABSTRACT:
The circuit and method for increasing the scan cell observability of response compactors is based on manipulation of x distribution in responses prior to taking them through a compactor. An x-align block is capable of delaying scan chains by judiciously computed values, and thus aligning x's within the same slices. The x-alignment is effected in the insertion of proper control data to the generic x-align hardware. As a result, fewer scan cells are masked due to response x's into other cells, reflecting into enhanced test quality. An ILP formulation can be used to identify the delay assignment that leads to the maximum number of observable scan cells. Alternatively, a computationally efficient greedy heuristic can be used to attain near-optimal results in reasonable run-time. Thus, the x-align block enhances the effectiveness of response compactors and reaps high test quality, even in the dense presence of response x's.
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Sinanoglu, O.; Almukhaizim, S., Sinanoglu, O. ; Almukhaizim, S. ; X-Align: Improving the Scan Cell Observability of Response Compactors, Mar. 16, 2009, IEEE Circuits and Systems Society, vol. 17 , Issue:10, pp. 1392-1404.
X-Align: Improving the Scan Cell Observability of Response Compactors Ozgur Sinanoglu, Member, IEEE, and Sobeeh Almukhaizim, Member, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 17, No. 10, Oct. 2009.
Almukhaizim Sobeeh A.
Sinanoglu Ozgur
Gaffin Jeffrey A
Kuwait University
Litman Richard C.
Merant Guerrier
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