Circuit and method for fuse disposing in a semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S719000, C714S025000, C714S030000, C714S703000, C714S709000, C714S718000, C714S724000, C714S733000, C714S745000, C714S818000, C702S035000, C702S059000, C702S117000, C702S118000, C702S120000, C365S096000, C365S201000, C365S225700

Reexamination Certificate

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07395475

ABSTRACT:
A fuse disposing circuit executes a same test as in a state before a fuse is cut, even in case the fuse is cut. For this, the fuse disposing circuit in accordance with the invention includes a test mode enable confirmation section for informing whether a test mode is enabled; and a fuse set for providing a constant signal by using the output from the test mode enable confirmation section in case of the test mode, regardless of elimination or non-elimination of a fuse.

REFERENCES:
patent: 5140554 (1992-08-01), Schreck et al.
patent: 5517455 (1996-05-01), McClure et al.
patent: 5550394 (1996-08-01), Sukegawa et al.
patent: 5923598 (1999-07-01), Callahan
patent: 6121820 (2000-09-01), Shishikura
patent: 6667916 (2003-12-01), Kyung
patent: 7158435 (2007-01-01), Kobayashi et al.
patent: 2002/0093860 (2002-07-01), Kato et al.

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