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Semiconductor memory testing device and method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor memory testing device and method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor memory testing method and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory unit with repair circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Semiconductor memory with a circuit for testing the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory, memory device, and memory card

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory, memory device, and memory card

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Semiconductor memory, memory device, and memory card

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory, memory device, and memory card

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory, semiconductor memory system, and error...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor module

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor module including semiconductor memory device...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor module with a configuration for the self-test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor storage apparatus managing system,...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Semiconductor storage device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor storage device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor storage device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Semiconductor storage device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor storage device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
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Semiconductor storage device and memory test circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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