Semiconductor storage device and memory test circuit

Details Semiconductor storage device and memory test circuit Semiconductor storage device and memory test circuit

2011-08-30

2011-08-30

Gaffin, Jeffrey A (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S723000, C714S736000

Reexamination Certificate

active

08010853

ABSTRACT:
Each of a plurality of nonmatching detection circuits is provided for each bit, compares bit output of memory with an expected value corresponding to the bit output, and outputs a nonmatching detection signal when the bit output does not match the value. A selection circuit selects and outputs the output of one or more nonmatching detection circuits in the plurality of nonmatching detection circuits. When the selection circuit outputs at least one nonmatching detection signal, a nonmatching result holding circuit holds the value of the nonmatching detection signal.

REFERENCES:
patent: 6163491 (2000-12-01), Iwamoto et al.
patent: 6252805 (2001-06-01), So et al.
patent: 6275428 (2001-08-01), Fukuda et al.
patent: 6275963 (2001-08-01), Maeno et al.
patent: 2001/0000449 (2001-04-01), Satoh
patent: 2001/0005014 (2001-06-01), Koshikawa
patent: 2002/0141259 (2002-10-01), Mak et al.
patent: 2005/0015690 (2005-01-01), Motomochi
patent: 2005/0207245 (2005-09-01), Kang
patent: 2005/0278595 (2005-12-01), Anzou
patent: 2007/0011535 (2007-01-01), Anzou et al.
patent: 3-16080 (1991-02-01), None
patent: 6-259994 (1994-09-01), None
patent: 8-262116 (1996-10-01), None
patent: 11-86593 (1999-03-01), None
patent: 2974313 (1999-09-01), None
patent: 2000-48599 (2000-02-01), None
patent: 2000-111618 (2000-04-01), None
patent: 3193622 (2001-05-01), None
patent: 2002-163899 (2002-06-01), None
patent: 2003-346498 (2003-12-01), None
patent: 2004-144717 (2004-05-01), None
patent: 2004-219310 (2004-08-01), None
patent: 2004-530243 (2004-09-01), None
patent: 2005-38511 (2005-02-01), None
patent: 2005-276423 (2005-10-01), None
patent: 2006-114192 (2006-04-01), None
patent: 02/080183 (2002-10-01), None
patent: 02/080183 (2002-10-01), None
Notice of Rejection Grounds for corresponding Japanese patent application No. 2005-289044, mailed Apr. 12, 2011.

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