Semiconductor memory with a circuit for testing the same

Details Semiconductor memory with a circuit for testing the same Semiconductor memory with a circuit for testing the same

2007-03-13

2009-12-29

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

Reexamination Certificate

active

07640467

ABSTRACT:
Upon conduct of a test on a semiconductor memory in a merged LSI or the like, data signals from a small data bus width are simultaneously written to a plurality of memory cells of a memory core. Then, a coincidence detection circuit makes a comparison between data read from the plurality of memory cells in expectation of a coincidence thereof. When the coincidence detection circuit detects the coincidence of the data, a data compression circuit compresses the compared data, and then outputs the compressed data. On the other hand, when the coincidence detection circuit detects an anticoincidence of the data, the data compression circuit converts the different data into fixed data, and then outputs the converted data.

REFERENCES:
patent: 6182262 (2001-01-01), Seyyedy
patent: 6438667 (2002-08-01), Shinozaki
patent: 6862662 (2005-03-01), Cloud
patent: 6996766 (2006-02-01), Cypher
patent: 7146547 (2006-12-01), Fukatsu
patent: 7149944 (2006-12-01), Okawa et al.
patent: 7203890 (2007-04-01), Normoyle
patent: 7257762 (2007-08-01), Holm et al.
patent: 7406637 (2008-07-01), Fukuda
patent: 2002/0004923 (2002-01-01), Haraguchi
patent: 2005/0152190 (2005-07-01), Fukuda
patent: 2005/0204239 (2005-09-01), Miyaji et al.
patent: 2006/0161824 (2006-07-01), Brummel et al.
patent: 6-290587 (1994-10-01), None

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